TSP #237 - Rohde & Schwarz LCX200 Precision 10MHz LCR Meter Review, Tutorial, Teardown & Experiments
In this episode Shahriar presents a detailed review of the Rohde & Schwarz LCX200 LCR meter. The new LCR platform from Rohde & Schwarz can operate up to 10MHz with a basic accuracy of ±0.05% for impedance measurements:
With capabilities such as binning, logging and sweeps, there is a lot to talk about! This review is organized as follows:
00:00 – Introductions
00:46 – Instrument overview, front & back panels
02:57 – Test fixtures and fixture teardown
04:28 – Detailed teardown, architecture, sub-component overview
11:23 – Remote interface, GUI overview, measurement parameters, fixture compensation
15:14 – Capacitor standard measurement, parameters setup, incident voltage, LowZ mode, auto-ranging
19:43 – Capacitor impairment measurements, Cs/Rs/Cp/Rp comparison, DC resistance & leakage measurements
21:44 – In-circuit measurements considerations, active device impacts
22:49 – Variable capacitor measurements, logging & plotting performance
25:37 – LC resonance measurements, frequency sweep capabilities, SRF detection, data export & post processing
29:22 – PN junction varactor measurements, DC bias sweep, active device characterization
31:35 – Variable inductor measurements, current stimulus capabilities, quality factor measurements
32:59 – Transformer fixture & transformer characterization, number of turns, mutual inductance and transformer verifications
35:02 – Surface mount device measurements, setup for binning and statistical measurements, triggering
37:05 – External DC bias voltage setup, internal voltage readout, 40V capability
38:57 – Concluding remarks & future improvements
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