TSP #184 - Keithley 2470 1kV Source Measure Unit (SMU) Review, Teardown and Experiments
In this episode Shahriar reviews the latest addition to the Keithley Graphical SMU family. The Keithley 2470 SMU offers 1100 V and 10 fA capability and is optimized for characterizing and testing high voltage, low leakage devices, materials, and modules, such as Silicon Carbide (SiC), Gallium Nitride (GaN), power MOSFETs, transient suppression devices, circuit protection devices, power modules, batteries, etc. This review is organized as follows:
00:00 – Introduction, SMU comparison, Power Envelope
02:34 – Instrument front & back overview
06:43 – Brief teardown and internal design overview
12:29 – GUI overview, high-voltage capability & interlock function
14:45 – High-voltage leakage measurement, capacitor leakage, polarity reverse at 1000V
20:12 – Varistor characterization on two quadrants, graphing capability
26:09 – Gas discharge tube characterization, stress testing & cursor measurements
30:47 – Multidimensional sweep using Kickstart software and CMOS sub-threshold measurement
41:32 – TSP script building, programming multiple SMUs with feedback functions
46:07 – Concluding remarks
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