TSP #239 – SJL Instruments 6GHz GigaWave Sampling Oscilloscope Review, Teardown & Experiments

In this episode Shahriar review the new sampling oscilloscope from SJL Instruments. Our GigaWave™ digital sampling oscilloscopes offer 12-bit vertical resolution, 1-ps time resolution, and 6 GHz analog bandwidth, all in a tiny 4” form factor:

https://www.sjl-instruments.com/

This review is organized as follows:

00:00 – Introductions
00:34 – Sampling scope & real-time scope theory and comparison
04:13 – CDF versus PDF method of waveform reconstruction
06:12 – Teardown & circuit analysis
09:35 – Input return loss characteristics and channel isolation
10:36 – GUI overview, capturing a fast pulse, comparison with Keysight DCA-X, built-in measurements, dot and vector mode
19:09 – Eye diagram measurements, ISI measurements, multi-channel view
24:15 – Multi-tone capture, FFT functions
25:09 – Concluding remarks

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TSP #238 – Rohde & Schwarz FE170SR D-Band (110 – 170GHz) Sub-THz Frontend Overview & Experiments

In this episode Shahriar takes a close look at the Rohde & Schwarz FE170SR which is the world’s first fully abstracted D-Band front-end module. Intended for early sub-terahertz 6G research, the fully integrated module is capable of seamlessly interfacing with both spectrum analyzers and oscilloscopes – only a 10MHz reference is needed!

https://www.rohde-schwarz.com/us/products/test-and-measurement/frontends-and-converter/rs-fe170sr-frontend_334208.html

The video goes over the history and evolution of external mixers and front-ends to better capture the uniqueness of the FE170SR. The internal block diagram and theory of operation of the instrument is also presented. Experiments show detailed measurement techniques using the FE170SR and the RTP oscilloscope. The integration of the FE170SR with R&S VSE is also presented through demodulation of broadband QAM signals at a carrier of 145GHz.

Furthermore, the newly released R&S Thermal Power Sensor at D-Band is also shown in the video:

https://www.rohde-schwarz.com/us/products/test-and-measurement/rf-and-microwave-power-sensors/rs-nrpxxt-tn-twg-thermal-power-sensors_63493-197529.html

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TNP #46 – Torbal AD60 Precision Balance (0.001g) Repair, Teardown & Experiments

In this episode Shahriar takes a look at a Torbal precision scale capable of resolving 0.001g! Unfortunately the unit shows an error of “Unload” when powered on. The teardown of the unit as well as the principle operation is described. The teardown also reveals the problem with the scale mechanism which is a broken link. The repair correct the problem and the scale shows excellent accuracy with calibrated weights. The live evaporation of Acetone is also shown using the precision balance.

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TNP #45 – Tektronix TekVPI TPA-BNC (TekProbe Converter) Adapter Repair & Teardown

In this episode Shahriar upgrades the internal firmware of a TPA-BNC TekVPI adapter. The teardown of the adapter is presented and the internal architecture described. The firmware is copied from a newer unit to the faulty one and the adapter can now detect a wide range of probes.

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TSP #237 – Rohde & Schwarz LCX200 Precision 10MHz LCR Meter Review, Tutorial, Teardown & Experiments

In this episode Shahriar presents a detailed review of the Rohde & Schwarz LCX200 LCR meter. The new LCR platform from Rohde & Schwarz can operate up to 10MHz with a basic accuracy of ±0.05% for impedance measurements:

https://www.rohde-schwarz.com/us/products/test-and-measurement/lcr-meters-and-impedance-analyzers/rs-lcx-lcr-meter_63493-1172288.html

With capabilities such as binning, logging and sweeps, there is a lot to talk about! This review is organized as follows:

00:00 – Introductions
00:46 – Instrument overview, front & back panels
02:57 – Test fixtures and fixture teardown
04:28 – Detailed teardown, architecture, sub-component overview
11:23 – Remote interface, GUI overview, measurement parameters, fixture compensation
15:14 – Capacitor standard measurement, parameters setup, incident voltage, LowZ mode, auto-ranging
19:43 – Capacitor impairment measurements, Cs/Rs/Cp/Rp comparison, DC resistance & leakage measurements
21:44 – In-circuit measurements considerations, active device impacts
22:49 – Variable capacitor measurements, logging & plotting performance
25:37 – LC resonance measurements, frequency sweep capabilities, SRF detection, data export & post processing
29:22 – PN junction varactor measurements, DC bias sweep, active device characterization
31:35 – Variable inductor measurements, current stimulus capabilities, quality factor measurements
32:59 – Transformer fixture & transformer characterization, number of turns, mutual inductance and transformer verifications
35:02 – Surface mount device measurements, setup for binning and statistical measurements, triggering
37:05 – External DC bias voltage setup, internal voltage readout, 40V capability
38:57 – Concluding remarks & future improvements

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