TNP #37 – Fluke 789 ProcessMeter Teardown, Repair & Performance Verification

In this episode Shahriar investigates the problem preventing a Fluke 789 PrceossMeter from powering on. The issue is fairly simple and is quickly identified.
The basic functionality of the instrument (DC/AC voltage, current, resistance measurements) are verified as well as the current delivery of the unit.

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TSP #228 – Biggest Microwave Components & Instrumentation Exhibition – IEEE Microwave Symposium 2023

We are back at the International Microwave Symposium 2023, this year held in San Diego, California!

https://ims-ieee.org/

The industry exhibition event was absolutely huge this year, with the latest showing in microwave, mm-wave & THz components, instrumentations & test solutions. This video covers a tiny fraction of the latest gear on display. The video is organized by vendor:

00:00 – Introductions
00:53 – Rohde & Schwarz: https://www.rohde-schwarz.com/us/
07:36 – Keysight Technologies: https://www.keysight.com/
14:21 – Anritsu: https://www.anritsu.com/en-us/
18:07 – Tabor Electronics: https://www.taborelec.com/
19:33 – LPKF: https://www.lpkfusa.com/
21:12 – Siglent: https://siglentna.com/
23:40 – Eravant: https://www.eravant.com/
27:26 – Junkosha: https://www.junkosha.com/en
30:27 – VDI: https://www.vadiodes.com/en/
31:35 – FormFactor: https://www.formfactor.com/
33:49 – HyperLabs: https://www.hyperlabs.com/
35:01 – Samtec: https://www.samtec.com/
36:36 – QuinStar: https://quinstar.com/
37:43 – MPI Corporation: https://www.mpi-corporation.com/
40:33 – Tektronix: https://www.tek.com/en
41:53 – Pickering: https://www.pickeringtest.com/en-us/
45:20 – Boonton Instruments: https://boonton.com/
48:52 – Holzworth Instrumentation: https://holzworth.com/

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TSP #227 – A 30GHz Static Frequency Divider from Fraunhofer Tutorial, Teardown & Characterization

In this episode Shahriar presents a deep dive into mm-Wave frequency divider; in particular static frequency dividers. These blocks are ubiquities in nearly every modern integrated circuits. The principle operation, circuit topologies and limitations are presented with several publications as examples.
The 30GHz static divider is then characterized extensively in both time domain and frequency domain. The measurements includes self-oscillation frequency, output waveform shape, input/output phase-noise relationship and the impact of temperature on self-oscillation frequency.
A detailed module teardown is also presented with focus on packaging techniques as well as closeup of the die. The integrated circuit is analyzed and the relationship between the schematic and layout is established.

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TSP #226 – Saker 50kV Common-Mode Fiber Isolated Active Probe (XFVP) Review, Teardown & Experiments

In this episode Shahriar reviews the Saker fiber-optically isolated active voltage probe XFVP. The fully galvanically isolated probe can reject common-mode signals in the tens of thousands of volts range. Signals with fast rising common-mode can also be rejected thanks to its high bandwidth of beyond 250MHz. Information about the Saker probe can be found here:

https://saker-mv.com/fiber-isolated-voltage-probe/

This review is organized as follows:

00:00 – Introduction & optical probe overview, principle of operation, dividers and accessories
05:07 – Full teardown of the probe head, probe body and 500x attenuator box
09:28 – Differential probe versus an optically isolated probe architecture
11:22 – Excess noise, SNR, dynamic range, THD and auto-calibration experiments
18:13 – Measured bandwidth of probe, S-parameters, gain ripple, phase response and group delay
19:47 – Measuring a GaN switching behavior with 400V of common-mode signal swing
27:03 – Concluding remarks

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TNP #36 – Tektronix TCP0030 120MHz, 30A AC/DC Current Probe Teardown, & Failure Analysis

In this episode Shahriar takes a look at a pair of Tektronix TCP0030 current probes which fail the degauss function. The principle theory of the probe is discussed as well as the teardown of the probe head.
The failure is traced to a disconnected Hall effect sensor inside the transformer assembly. Unfortunately the assembly is fully potted and cannot be disassembled without destroying the part. A destructive disassembly shows the unique and intricate design of the transformer module and ultra thin embedded Hall effect sensor. Although neither of the probes could be repaired, the teardown and analysis provides insight in to the probe operation and typical failure point.

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