Tag Archive for Parts

Teardown, Repair & Experiments with a Voltech PM3000A 3-Phase Universal Power Analyzer

In this episode Shahriar investigates the failure of a Voltech PM3000A 3-Phase Universal Power Analyzer. This instrument is capable of advanced measurements on power profile and performance of a DUT. The unit shows “Voltage & Current OVERLOAD” condition on all channels even without a DUT connected.

The teardown of the unit reveals the isolation techniques used between the analog sampling heads and the main digital/DSP board. The instrument uses a combination of transformers and optocouplers to provide power to the sampling heads and receive digitized data from the voltage/current ADCs.

Close examination of the unit shows a faulty capacitor on the AC power supply feeding the sampling heads. The capacitor is replaced which corrects the overload condition. The unit is then used to measure the power profile of a simple glue-gun. The PF and THD measurements show that the glue-gun is equipped with a triac for power control; an expected result for a simple glue-gun.

Teardown & Repair of an Agilent N5182A MXG 100kHz – 3GHz Vector Signal Generator

In this episode Shahriar repairs a malfunctioning Agilent N5182A MXG Vector Signal Generator. While the instrument operates perfectly above 250MHz, below 250MHz the output is very low with a significant increase in the noise floor.

The block diagram of the synthesizer is presented showing various RF signal paths. It is shown that the sub-250MHz band is derived from a hetrodyne section which is where the problem located. Using a EM probe, various signal flows are discovered on the main board and compared with the block diagram. The main problem is traced to a doubler circuit which generates a 1-GHz LO signal for the hetrodyne section. The doubler comprises a transformer coupled to a dual diode surface mount IC. The IC is replaces which restores the doubler functionality and repairs the instrument.

Teardown & Repair of an Agilent 1169A 12GHz Smart Active Probe (And a Puzzle!)

In this episode Shahriar examines a failed Agilent 1169A 12GHz Smart Active Probe. The probe does not get recognized by the oscilloscope and therefore cannot be calibrated. The instrument uses an I2C interface to the probe to download the probe’s specifications and characteristics.

The probe teardown reveals a simple I2C EEPROM IC. After removing the IC it becomes clear that the chip is damaged and must be replaced. A duplicate probe is used to copy the EEPROM data onto a new IC which revives the probe. With the help of the community, the CRC checksum code is discovered and the probe is assigned a new serial number.

Tektronix AFG31000 2GS/s Arbitrary Function Generator Review, Teardown & Experiments

In this episode Shahriar reviews the new Tektronix AFG31000 Arbitrary Function Generator. The AFG31000 series with InstaView™ technology is the first high-performance AFG with built-in waveform generation applications, patented real-time wave monitoring, and a modern user interface. The instrument is capable of 2GS/s waveform generation up to 250MHz and 14-bits of vertical resolution. This review is organized as follows:

00:08 – Introductions
01:01 – Front panel, rear panel and instrument design
03:44 – Detailed teardown, analysis, architecture and components
17:30 – GUI overview and basic functions
20:25 – Broadband FM modulation experiments
23:55 – InstaView experiments with a non-linear impedance
35:38 – Equation editor, waveform builder and advance sequencing
51:21 – Concluding remarks

Teardown, Repair & Analysis of a Rohde & Schwarz FSEK 20Hz – 40GHz Spectrum Analyzer

In this episode Shahriar takes a look at a non-functional R&S FSEK 40GHz spectrum analyzer. The instrument’s LCD screen back light no longer works and the front glass is broken. Furthermore, no testing can be done until these problems are resolved. The CCFL tube is replaced with an LED counterpart and a new front panel glass is also installed.

After power on it becomes clear that the instrument has other defects. The internal PLL is unlocked. It is observed that the OCXO module is cold and potentially not working. Examination of the LO board shows a bad inductor on the DC filter side. After this problem the instrument operates correctly but only for signals below 7GHz. After further testing it is discovered that the YIG tuned filter on the pre-selector path is not tuning at all. Eventually the fault is traced to some operational amplifiers on the YIG driver board. The repaired instrument is verified for correct operation.

  • Social Media

    twittergooglepluswordpressyoutuberedditrssemail
  • Administrator

  • Archives

This site is protected by Comment SPAM Wiper.