Tag Archive for Optical

Teardown & Experiments with an HP 83475B 500MHz Lightwave Analyzer / Oscilloscope

In this short episode Shahriar takes a close look at an HP 83475B Lightwave Communication Analyzer / Oscilloscope which offers a 500MHz bandwidth on both the electrical and optical inputs. The sub-sampling scope has a minor issue where the CRT brightness knob has been disconnected internally.

The teardown of the scope reveals the sub-sampling ADCs, O/E front-end as well as CRT driver circuitry. The operation of the scope is demonstrated using various electrical and optical NRZ and multi-level signals.

Teardown & Analysis of an Anritsu MN9610B Variable Optical Attenuator

In this short episode Shahriar takes a detailed look at an Anritsu variable optical attenuator operating in the L- and C-Bands. The mechanical attenuator is defective and provides an opportunity for complete disassembly and examination of the free-space optics, mechanical components and electronics.

The electronics drive a pair of DC motors with potentiometer decoders in feedback along with operational amplifiers and a DAC. This allows the microprocessor to set the exact position of the motors based on calibrated values stored on EPROM. The free-space optics consists of two back-to-back disks with radial metal coatings. Depending on the position of each wheel, the coating limits the transmission of the light through the wheel causing attenuation. The entire housing is hermetically sealed to prevent degradation of the disks.

Teardown, Experiments & Calibration of an Ist-Rees Laser Spectrum Analyzer

In this short episode Shahriar takes a close look at an Ist-Rees laser spectrum analyzer. This simple instrument is based on a continuously rotating diffraction mirror to detect various wavelengths. A trigger signal is used to denote the beginning of the scan and the front-panel display shows the current selected wavelength. By aligning the output signal with the trigger signal the wavelength of the input light can be measured.

After the unit teardown, the instrument is used to measure the wavelength of a semiconductor 1310nm laser. The unit is calibrated using this source and is then used to measure the infrared leakage wavelength from a green laser pointer.

Teardown & Repair of an Agilent 8164A Lightwave Measurement System

In this episode Shahriar investigates a failure of an Agilent 8164A lightwave measurement system. A quick power-on test reveals the main power supply of the unit has failed and has caused catastrophic damage to some of the instrument modules.

After the teardown of the unit the power supply module is examined. Tracing the signal path from the switching transformers shows a pair of damages rectifier diodes. A new component with similar specifications is salvaged from a different power supply. After the installation, the unit can be powered on and detects all the installed modules. Most of the modules are functional, however the main tunable laser module fails alignment. The repair of that component is reserved for another video.

Teardown & Analysis of an Agilent 86109B Optical/Electrical DCA-X Oscilloscope Module

In this episode Shahriar presents the inner workings of an Agilent 86109B optical/electrical DCA-X oscilloscope module. This particular model offers up to 50GHz of electrical bandwidth and an optical input capable of receiving up to 40Gb/s data rates. The differences between a real-time and sub-sampling oscilloscopes are presented with focus on ADC resolution, signal periodicity requirements and input bandwidth. The block diagram of the module as well as a sub-sampling oscilloscope is also presented.

The teardown of the module shows various components such as samplers, O/E conversion block, impulse generator as well as a step-recovery diode driver. I/O interfaces as well as various analog blocks are also shown. Several modules are further disassembled to observe the inner semiconductor designs under the microscope.

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