Tag Archive for Experiments

SAF Ka-Band Spectrum Compact 24 – 40GHz Portable Analyzer Review, Teardown & Experiments

In this episode Shahriar reviews another SAF Spectrum Contact. This model covers the Ka-Band (24GHz-40GHz), intended for 5G mm-Wave field measurements. The K-Band unit offers additional functionality such as 10MHz minimum span as well as RBW/VBW control down to 100kHz.

The teardown of the instrument reveals a similar architecture to the previously reviewed V-Band unit. Various system components are analyzed and explained. Some of the instrument’s GUI capabilities are also presented.

For experiments, a 900-element 38GHz planer array antenna is used at a distance of 2.5 meters. A slow-FM modulated RF signal centered at 38GHz is generated and measured which allows for the antenna gain characterization as well as exploration of the instrument’s capabilities.

Tutorial on Theory, Characterization & Measurement Techniques of Phase Noise

In this episode Shahriar demonstrates the fundamentals of Phase Noise. The theory behind phase noise is presented both from a time-domain and frequency domain points of view. Various mathematical equations which represent phase noise behavior is also presented.

Phase noise measurement challenges and techniques are covered. Capabilities and limitations of different instruments for phase noise characterization is explained. The experiments show AM/PM modulations both in time and frequency domain and their relationships to phase noise measurements. Using a spectrum analyzer the phase noise of several synthesizers are shown. However, it is clear that the phase noise of an ultra-clean 1-GHz reference signal cannot be measured using traditional methods.

The concept of cross-correlation is introduced as a means of measuring phase noise below the phase noise of the measurement instrument. The block diagram of the an Agilent Phase Noise Analyzer is presented followed by a short teardown. The measured phase nose of the ultra-clean 1-GHz source is shown using correlation techniques which matches the datasheet.

Siglent SVA1032X 3.2GHz Spectrum & Vector Network Analyzer Review, Teardown & Experiments

In this episode Shahriar reviews the newly released Siglent SVA1032X. The SVA series instrument spectrum & vector network analyzers are powerful and flexible tools for broadcast and RF device / system testing. With a wide frequency range covering 9 kHz to 3.2 GHz, the analyzer delivers reliable automatic measurements and plenty of features including a tracking generator and multiple modes of operation. This review is organized as follows:

00:09 – Introduction and instrument overview
02:25 – Complete teardown and detailed analysis of the instrument hardware
23:36 – Basic instrument GUI operation and overload detection limitations
28:38 – Tracking generator signal purity and performance
30:06 – Instrument internal phase noise performance
33:01 – VNA operation and amplifier impedance tuning experiment
39:28 – Amplifier characterization using built-in functions
44:20 – Digital demodulation experiments
49:30 – Distance to fault experiments using built-in functions
49:16 – Concluding remarks

Tektronix AFG31000 2GS/s Arbitrary Function Generator Review, Teardown & Experiments

In this episode Shahriar reviews the new Tektronix AFG31000 Arbitrary Function Generator. The AFG31000 series with InstaView™ technology is the first high-performance AFG with built-in waveform generation applications, patented real-time wave monitoring, and a modern user interface. The instrument is capable of 2GS/s waveform generation up to 250MHz and 14-bits of vertical resolution. This review is organized as follows:

00:08 – Introductions
01:01 – Front panel, rear panel and instrument design
03:44 – Detailed teardown, analysis, architecture and components
17:30 – GUI overview and basic functions
20:25 – Broadband FM modulation experiments
23:55 – InstaView experiments with a non-linear impedance
35:38 – Equation editor, waveform builder and advance sequencing
51:21 – Concluding remarks

Teardown, Repair & Analysis of a Rohde & Schwarz FSEK 20Hz – 40GHz Spectrum Analyzer

In this episode Shahriar takes a look at a non-functional R&S FSEK 40GHz spectrum analyzer. The instrument’s LCD screen back light no longer works and the front glass is broken. Furthermore, no testing can be done until these problems are resolved. The CCFL tube is replaced with an LED counterpart and a new front panel glass is also installed.

After power on it becomes clear that the instrument has other defects. The internal PLL is unlocked. It is observed that the OCXO module is cold and potentially not working. Examination of the LO board shows a bad inductor on the DC filter side. After this problem the instrument operates correctly but only for signals below 7GHz. After further testing it is discovered that the YIG tuned filter on the pre-selector path is not tuning at all. Eventually the fault is traced to some operational amplifiers on the YIG driver board. The repaired instrument is verified for correct operation.

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