Tag Archive for Analog

Tektronix MDO4104C-6 Mixed Domain Oscilloscope (MDO4000C) Review, Teardown and Experiments

In this episode Shahriar performs a full review on the Tektronix MDO4000C series mixed domain oscilloscope, particularly model MDO4104C-6. The MDO4000C combines up to six instruments including a function generator and a built-in spectrum analyzer. Unlike any other instrument, it can synchronize RF, analog and digital channels. These correlated measurements provide insight into difficult to find problems particularly intermittent events.

This review begins with a comparison between the MDO4000B and MDO4000C instruments. The full review of the MDO4000B can be viewed here. All experiments demonstrated in the MDO4000B review are also relevant to the MDO4000C instrument.

The teardown of the instrument reveals a multi-board construction where the ADCs, FPGAs, application processor and memory are on the main system board. A complete analysis of the entire system is presented including the operation of the RF module.

In order to demonstrate the instrument’s capabilities, an encrypted frequency hopping transmitter system is analyzed. The system exhibits various problems such as high BER, low SFDR, poor phase-noise and EVM. The MDO4000C is used to perform advanced measurements across analog, digital and RF domain to track and resolve these problem. The complete block diagram of the experiment can be found here.

Teardown & Repair of an Agilent 8164A Lightwave Measurement System

In this episode Shahriar investigates a failure of an Agilent 8164A lightwave measurement system. A quick power-on test reveals the main power supply of the unit has failed and has caused catastrophic damage to some of the instrument modules.

After the teardown of the unit the power supply module is examined. Tracing the signal path from the switching transformers shows a pair of damages rectifier diodes. A new component with similar specifications is salvaged from a different power supply. After the installation, the unit can be powered on and detects all the installed modules. Most of the modules are functional, however the main tunable laser module fails alignment. The repair of that component is reserved for another video.

Teardown & Repair of an Agilent 54845A 1.5GHz 8GS/s Infinium Oscilloscope

In this episode Shahriar repairs an Agilent 54845A oscilloscope with an intermittent failure. The instrument occasionally fails self-calibration and the displayed waveform shows undesired spurious activities. The teardown of the instrument reveals customized front-end section coupled into a ceramic-substrate ADC ASIC designed by Agilent. The packaged ADCs are placed in sockets. The ICs are removed and the ceramic carrier is cleaned; this resolves the intermittent problem with the channels. The architecture of the scope is also presented. The functionality of the scope is verified through self-calibration, self-test and measurement of various waveform.

Teardown, Repair & Experiments of an Agilent E7495B 2.7GHz Base Station Test Set

In this episode Shahriar repairs an Agilent E7495B 2.7GHz base-station test set capable of VSWR measurements as well as spectrum analysis. This particular unit is well equipped with many options however does not power on. A full teardown of the instrument reveals a faulty DC power conditioning module. The input filtering capacitor has failed. After component replacement, the unit is re-assembled. The functionality of the instrument is verified as well as a few quick experiments demonstrating various options.

Fluke PM6680B Frequency Counter 10MHz OCXO Reference Upgrade Module

In this short episode Shahriar upgrades the recently repaired Fluke PM6680B with a new OCXO design by Dan Watson. The design of the module is examined as well various considerations for providing ultra clean 10MHz reference for instrumentation.  After module installation the unit functionality is verified. More information about the module is available here and here.

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